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“A Testing Challenge” a Joint Digital Communication KTN and Cambridge Wireless Testing SIG Event

January 27, 2010 | Author: | Posted in Semiconductors

Cambridge, UK. 27 January 2010. The ever-increasing complexity of wireless devices and the unpredictability of exactly how and where they will be used is making it increasingly challenging to ensure they will work as intended in the real world. The Digital Communications Knowledge Transfer Network (DCKTN) and Cambridge Wireless have joined together to bring this …

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